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publications by dr. M. Hagedoorn

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dr. M. Hagedoorn

• contact information
• my technical reports
• former member of group games and virtual worlds

some publications

Veltkamp, R.C. & Hagedoorn, M. (2001). State-of-the-art in shape matching. In M. Lew (Ed.), Principles of Visual Information Retrieval (pp. 87-119). Springer.

Hagedoorn, M., Overmars, M.H. & Veltkamp, R.C. (2000). A New visibility partition for affine pattern matching. In Proc. Discrete Geometry for Computer Imagery conference, DGCI 2000. (pp. 358-370). Berlin: Springer-Verlag.

Hagedoorn, M. & Veltkamp, R.C. (2000). A Robust Afine Invariant Metric on Boundary Patterns. In M.A. Rodrigues (Ed.), Invariants for Pattern Recognition and Classification (pp. 63-80). World Scientific.

Hagedoorn, M., Overmars, M.H. & Veltkamp, R.C. (2000). A robust affine invariant similarity measure based on visibility. In Proceedings EURO-CG-2000: The 16th Eoropean Workshop on Computtational Geometry (pp. 112-116). Eilat.

Hagedoorn, M. (2000, September 18). Pattern Matching using similarity measures. Utrecht University (184 pag.) (Utrecht: Utrecht University). Prom./coprom.: prof. dr. M.H. Overmars & Prof.dr. R.C. Veltkamp.

Veltkamp, R.C. & Hagedoorn, M. (2000). Shape Similarities, Properties, and Constructions. In Advances in Visual Information Systems, Proceedings of the 4th International Conference, VISUAL 2000, Lyon, France, November 2000 (pp. 467-476). Springer.

Veltkamp, R.C. & Hagedoorn, M. (2000). Shape similarity measures, properties, and constructions. (UU-CS2000-37 ). Utrecht, The Netherlands: Utrecht University: Information and Computing Sciences.

Hagedoorn, M. & Veltkamp, R.C. (1999). A Robust Afine Invariant Metric on Boundary Patterns. International Journal of Pattern recognition and Artificial Intelligence, 13, 1151-1164.

Hagedoorn, M. & Veltkamp, R.C. (1999). Measuring resemblance of complex patterns. In G. Bertrand, M. Couprie & L. Perroton (Eds.), Discrete Geometry for Computer Imagery, "Lecture Notes in Computer Science" (pp. 286-298). Berlin: Springer Verlag.

Hagedoorn, M. & Veltkamp, R.C. (1999). Metric pattern spaces. (UU-CS1999-03 ). Utrecht, The Netherlands: Utrecht University: Information and Computing Sciences.

Hagedoorn, M., Overmars, M.H. & Veltkamp, R.C. (1999). New visibility partitions with applications in affine pattern matching. (UU-CS1999-21 ). Utrecht, The Netherlands: Utrecht University: Information and Computing Sciences.

Hagedoorn, M. & Veltkamp, R.C. (1999). Reliable and Efficient pattern matching using an afine invariant metric. International Journal of Computer Vision, 31(2,3), 103-115.

Veltkamp, R.C. & Hagedoorn, M. (1999). State-of-the-art in shape matching. (UU-CS1999-27 ). Utrecht, The Netherlands: Utrecht University: Information and Computing Sciences.

Hagedoorn, M. & Veltkamp, R.C. (1997). A General method for Partial Point Set Matching. In J.D. Boissonnat (Ed.), Proceedings of the 13th Annual ACM Symposium on Computational Geometry (pp. 406-408). New York, U.S.A.: ACM Press.

Hagedoorn, M. & Veltkamp, R.C. (1997). Reliable and efficient pattern matching using an affine invariant metric. (UU-CS1997-33 ). Utrecht, the Netherlands: Utrecht University: Information and Computing Sciences.