|Website:||website containing additional information|
|Period:||period 2 (week 46 through 5, i.e., 12-11-2007 through 1-2-2008; retake week 11)
|Participants:||up till now 9 subscriptions|
|Schedule:||Dit is een oud rooster!
|Contents:||The course Pattern Recognition is about the classification and analysis
There are numerous applications of pattern recognition techniques, such as
industrial inspection (e.g. quality control of materials), biomedical
inspection (e.g. chromosome analysis), remote sensing (earth observation),
astronomy (galaxy research), and security (e.g. fingerprint and handwriting
Because more and more measured data is generated, the need for automatic
analysis also increases.
The seminar will cover two main topics: basic statistical pattern recognition, and pattern recognition in the application domain biometrics.
|Literature:||For statistical pattern recognition: S. Theodoridis, K. Koutroumbas, Pattern Recognition, third edition, Academic Press, ISBN 0-12-369531-7.
For biometric pattern recognition: articles will be made available.
After a few introductory lectures by the lecturer, students present specific articles and book chapters.
|Exam form:||The grade depends on the given presentations (40%) summaries (40%) and a small written exam (20%).
|Minimum effort to qualify for 2nd chance exam:||To qualify for a retake, the overall grade must be at least a 4.|
|Description:||Topics that are treated are: probability density functions, Bayesian
decision theory, feature space, supervised and unsupervised classification,
parametric and non-parametric decision models, geometric patterns,
shape similarity measures.
Neural networks are not treated to avoid overlap with the course Neural Networks,
logic and reasoning aspects are not treated to avoid overlap with the
course Probabilistic Reasoning.