Department of Information and Computing Sciences

Departement Informatica Onderwijs
Bachelor Informatica Informatiekunde Kunstmatige intelligentie Master Computing Science Game&Media Technology Artifical Intelligence Business Informatics

Onderwijs Informatica en Informatiekunde

Vak-informatie Informatica en Informatiekunde

Pattern recognition

Te lang geleden voor docent- en roosterinformatie
Exam:
week: 5Wed 30-1-201913.30-16.30 uurroom: EDUC-THEATRON
week: 16Wed 17-4-201913.30-16.30 uurroom: -retake exam
Contents:In this course we study statistical pattern recognition as well as geometric pattern recognition.

The subjects treated in the part on statistical pattern recognition are:

  • General principles of data analysis: overfitting, model selection, regularization, the curse of dimensionality.
  • Linear statistical models for regression and classification.
  • Neural networks.
  • Support vector machines.

The subjects treated in the part on geometrical pattern recognition are:

  • Model fitting.
  • Matching point patterns.
  • Matching curves and regions.
Knowledge of elementary probability theory, statistics and linear algebra is presupposed.
Literature:Christopher M. Bishop, Pattern Recognition and Machine Learning, Springer 2006.
Course form:Lectures and Computer Lab
Exam form:Written Exam and Practical Assignments
Minimum effort to qualify for 2nd chance exam:Om aan de aanvullende toets te mogen meedoen moet de oorspronkelijke uitslag minstens 4 zijn.
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